PRECISE DETERMINATION OF THE PERIODICITY FOR MO/SI AND W/C METALLIC MULTILAYERS BY ELECTRON AND X-RAY-DIFFRACTION

PRECISE DETERMINATION OF THE PERIODICITY FOR MO/SI AND W/C METALLIC MULTILAYERS BY ELECTRON AND X-RAY-DIFFRACTION

書目詳細資料
Main Authors:	Jiang, S, Zou, J, Cockayne, D, Hu, A, Sikorski, A
格式:	Journal article
出版:	1995

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