PRECISE DETERMINATION OF THE PERIODICITY FOR MO/SI AND W/C METALLIC MULTILAYERS BY ELECTRON AND X-RAY-DIFFRACTION

PRECISE DETERMINATION OF THE PERIODICITY FOR MO/SI AND W/C METALLIC MULTILAYERS BY ELECTRON AND X-RAY-DIFFRACTION

Détails bibliographiques
Auteurs principaux: Jiang, S, Zou, J, Cockayne, D, Hu, A, Sikorski, A
Format: Journal article
Publié: 1995

Documents similaires