PRECISE DETERMINATION OF THE PERIODICITY FOR MO/SI AND W/C METALLIC MULTILAYERS BY ELECTRON AND X-RAY-DIFFRACTION

Geahča maid

• Diffraction behaviour of three-component Fibonacci Ta/Al multilayer films
  Dahkki: Jiang, S, et al.
  Almmustuhtton: (1997)
• AN ELECTRON-DIFFRACTION AND MICROSCOPY INVESTIGATION OF QUASI-PERIODIC TA-AL SUPERLATTICES
  Dahkki: Jiang, S, et al.
  Almmustuhtton: (1992)
• X-Ray Diffraction Technique for Residual Stress Measurement in NiCrMo Alloy Weld Metal
  Dahkki: Vladimir Ivanovitch Monine, et al.
  Almmustuhtton: (2018-01-01)
• Wave diffraction by periodic multilayer structures /
  Dahkki: Litvinenko, L. N. (Leonid Nikolaevich), et al.
  Almmustuhtton: (c201)
• Investigation of structural and reflective characteristics of short-period Mo/B4C multilayer X-ray mirrors
  Dahkki: Roman Shaposhnikov, et al.
  Almmustuhtton: (2024-03-01)