Scattering-type near-field optical microscopy characterization of topological insulator Bi2Te3 nanowires
Topological Insulator (TI) devices have potential applications in spintronic and low-loss communication devices. However, they are difficult to characterize with standard far-field spectroscopy due to contributions from both the surface and the bulk. Utilizing the surface-sensitive scattering type S...
| Những tác giả chính: | , , , , , , , , |
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| Định dạng: | Conference item |
| Ngôn ngữ: | English |
| Được phát hành: |
IEEE
2023
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