Scattering-type near-field optical microscopy characterization of topological insulator Bi2Te3 nanowires

Scattering-type near-field optical microscopy characterization of topological insulator Bi2Te3 nanowires

Topological Insulator (TI) devices have potential applications in spintronic and low-loss communication devices. However, they are difficult to characterize with standard far-field spectroscopy due to contributions from both the surface and the bulk. Utilizing the surface-sensitive scattering type S...

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Bibliographic Details
Main Authors:	Johnson, D, Vincent, T, Liu, X, Gholizadeh, B, Schoenherr, P, Hesjedal, T, Kazakova, O, Huáng, N, Boland, J
Format:	Conference item
Language:	English
Published:	IEEE 2023

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