Gao, Y., Beriwal, S., Craik, R., Papageorghiou, A., & Noble, J. (2020). Label efficient localization of fetal brain biometry planes in ultrasound through metric learning. Springer.
Chicagoスタイル(17版)引用形式Gao, Y., S. Beriwal, R. Craik, AT Papageorghiou, , JA Noble. Label Efficient Localization of Fetal Brain Biometry Planes in Ultrasound Through Metric Learning. Springer, 2020.
MLA(9版)引用形式Gao, Y., et al. Label Efficient Localization of Fetal Brain Biometry Planes in Ultrasound Through Metric Learning. Springer, 2020.
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