APA引文

Gao, Y., Beriwal, S., Craik, R., Papageorghiou, A., & Noble, J. (2020). Label efficient localization of fetal brain biometry planes in ultrasound through metric learning. Springer.

Chicago Style (17th ed.) Citation

Gao, Y., S. Beriwal, R. Craik, AT Papageorghiou, and JA Noble. Label Efficient Localization of Fetal Brain Biometry Planes in Ultrasound Through Metric Learning. Springer, 2020.

MLA引文

Gao, Y., et al. Label Efficient Localization of Fetal Brain Biometry Planes in Ultrasound Through Metric Learning. Springer, 2020.