Gao, Y., Beriwal, S., Craik, R., Papageorghiou, A., & Noble, J. (2020). Label efficient localization of fetal brain biometry planes in ultrasound through metric learning. Springer.
芝加哥风格引文Gao, Y., S. Beriwal, R. Craik, AT Papageorghiou, 与 JA Noble. Label Efficient Localization of Fetal Brain Biometry Planes in Ultrasound Through Metric Learning. Springer, 2020.
MLA引文Gao, Y., et al. Label Efficient Localization of Fetal Brain Biometry Planes in Ultrasound Through Metric Learning. Springer, 2020.
警告：这些引文格式不一定是100％准确.