Applications of the weak beam technique of electron microscopy
Autor principal: | Cockayne, D |
---|---|
Formato: | Conference item |
Publicado em: |
1999
|
Registros relacionados
-
WEAK-BEAM ELECTRON-MICROSCOPY
por: Cockayne, D
Publicado em: (1981) -
THEORETICAL ANALYSIS OF WEAK-BEAM METHOD OF ELECTRON-MICROSCOPY
por: Cockayne, D
Publicado em: (1972) -
PRINCIPLES AND PRACTICE OF WEAK-BEAM METHOD OF ELECTRON-MICROSCOPY
por: Cockayne, D
Publicado em: (1973) -
DISLOCATIONS IN SEMICONDUCTORS AS STUDIED BY WEAK-BEAM ELECTRON-MICROSCOPY
por: Cockayne, D, et al.
Publicado em: (1979) -
STUDY OF GUINIER-PRESTON ZONES IN ALUMINUM-COPPER ALLOYS USING WEAK-BEAM TECHNIQUE OF ELECTRON-MICROSCOPY
por: Yoshida, H, et al.
Publicado em: (1976)