Structure determination of atomically controlled crystal architectures grown within single wall carbon nanotubes
Indirect high resolution electron microscopy using one of several possible data-set geometries offers advantages over conventional high-resolution imaging in enabling the recovery of the complex wavefunction at the specimen exit plane and simultaneously eliminating the aberrations present in the obj...
| 主要な著者: | , , , |
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| フォーマット: | Conference item |
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2005
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