Structure determination of atomically controlled crystal architectures grown within single wall carbon nanotubes

Indirect high resolution electron microscopy using one of several possible data-set geometries offers advantages over conventional high-resolution imaging in enabling the recovery of the complex wavefunction at the specimen exit plane and simultaneously eliminating the aberrations present in the obj...

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Hlavní autoři: Kirkland, A, Meyer, MR, Sloan, J, Hutchison, J
Médium: Conference item
Vydáno: 2005