Cita APA (7th ed.)

Jin, X., Peng, C., Deng, Y., Barbieri, M., Nunn, J., & Walmsley, I. (2013). Sequential path entanglement for quantum metrology.

Cita Chicago (17th ed.)

Jin, X., C. Peng, Y. Deng, M. Barbieri, J. Nunn, i I. Walmsley. Sequential Path Entanglement for Quantum Metrology. 2013.

Cita MLA (9th ed.)

Jin, X., et al. Sequential Path Entanglement for Quantum Metrology. 2013.