Cita APA (7a ed.)

Jin, X., Peng, C., Deng, Y., Barbieri, M., Nunn, J., & Walmsley, I. (2013). Sequential path entanglement for quantum metrology.

Cita Chicago Style (17a ed.)

Jin, X., C. Peng, Y. Deng, M. Barbieri, J. Nunn, y I. Walmsley. Sequential Path Entanglement for Quantum Metrology. 2013.

Cita MLA (9a ed.)

Jin, X., et al. Sequential Path Entanglement for Quantum Metrology. 2013.