Sequential path entanglement for quantum metrology.
Path entanglement is a key resource for quantum metrology. Using path-entangled states, the standard quantum limit can be beaten, and the Heisenberg limit can be achieved. However, the preparation and detection of such states scales unfavourably with the number of photons. Here we introduce sequenti...
| Main Authors: | , , , , , |
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| 格式: | Journal article |
| 語言: | English |
| 出版: |
2013
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