Instability of increased contact resistance in silicon solar cells following post-firing thermal processes
Recently, there have been reports of increased series resistance as a consequence of thermal processes applied after the co‐firing of screen‐printed silicon solar cells. A previous observation of this effect on very heavily diffused emitters concluded that the increased series resistance is the resu...
Main Authors: | , , , , , , , , |
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Format: | Journal article |
Language: | English |
Published: |
Wiley
2017
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_version_ | 1797088629978300416 |
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author | Chan, C Hamer, P Bourret-Sicotte, G Chen, R Ciesla, A Hallam, B Payne, D Bonilla, RS Wenham, S |
author_facet | Chan, C Hamer, P Bourret-Sicotte, G Chen, R Ciesla, A Hallam, B Payne, D Bonilla, RS Wenham, S |
author_sort | Chan, C |
collection | OXFORD |
description | Recently, there have been reports of increased series resistance as a consequence of thermal processes applied after the co‐firing of screen‐printed silicon solar cells. A previous observation of this effect on very heavily diffused emitters concluded that the increased series resistance is the result of a thickening of the glass layer surrounding silver crystallites at the Ag‐Si interface. Here, large increases in the front silver contact resistance after particular thermal anneals are reported that have been used to mitigate carrier‐induced degradation (CID) in multi‐crystalline solar cells that cannot be fully explained by a thickening of the glass layer. Remarkably, under certain conditions the contact resistance immediately after annealing is found to be unstable − decreasing when a forward current is applied to the solar cell, and gradually increasing again once the forward current is removed. It is speculated that the movement of charged particles, most likely hydrogen, could be the cause of this instability. |
first_indexed | 2024-03-07T02:52:52Z |
format | Journal article |
id | oxford-uuid:ae4822a5-b0dd-437d-9386-3d3463103107 |
institution | University of Oxford |
language | English |
last_indexed | 2024-03-07T02:52:52Z |
publishDate | 2017 |
publisher | Wiley |
record_format | dspace |
spelling | oxford-uuid:ae4822a5-b0dd-437d-9386-3d34631031072022-03-27T03:41:24ZInstability of increased contact resistance in silicon solar cells following post-firing thermal processesJournal articlehttp://purl.org/coar/resource_type/c_dcae04bcuuid:ae4822a5-b0dd-437d-9386-3d3463103107EnglishSymplectic ElementsWiley2017Chan, CHamer, PBourret-Sicotte, GChen, RCiesla, AHallam, BPayne, DBonilla, RSWenham, SRecently, there have been reports of increased series resistance as a consequence of thermal processes applied after the co‐firing of screen‐printed silicon solar cells. A previous observation of this effect on very heavily diffused emitters concluded that the increased series resistance is the result of a thickening of the glass layer surrounding silver crystallites at the Ag‐Si interface. Here, large increases in the front silver contact resistance after particular thermal anneals are reported that have been used to mitigate carrier‐induced degradation (CID) in multi‐crystalline solar cells that cannot be fully explained by a thickening of the glass layer. Remarkably, under certain conditions the contact resistance immediately after annealing is found to be unstable − decreasing when a forward current is applied to the solar cell, and gradually increasing again once the forward current is removed. It is speculated that the movement of charged particles, most likely hydrogen, could be the cause of this instability. |
spellingShingle | Chan, C Hamer, P Bourret-Sicotte, G Chen, R Ciesla, A Hallam, B Payne, D Bonilla, RS Wenham, S Instability of increased contact resistance in silicon solar cells following post-firing thermal processes |
title | Instability of increased contact resistance in silicon solar cells following post-firing thermal processes |
title_full | Instability of increased contact resistance in silicon solar cells following post-firing thermal processes |
title_fullStr | Instability of increased contact resistance in silicon solar cells following post-firing thermal processes |
title_full_unstemmed | Instability of increased contact resistance in silicon solar cells following post-firing thermal processes |
title_short | Instability of increased contact resistance in silicon solar cells following post-firing thermal processes |
title_sort | instability of increased contact resistance in silicon solar cells following post firing thermal processes |
work_keys_str_mv | AT chanc instabilityofincreasedcontactresistanceinsiliconsolarcellsfollowingpostfiringthermalprocesses AT hamerp instabilityofincreasedcontactresistanceinsiliconsolarcellsfollowingpostfiringthermalprocesses AT bourretsicotteg instabilityofincreasedcontactresistanceinsiliconsolarcellsfollowingpostfiringthermalprocesses AT chenr instabilityofincreasedcontactresistanceinsiliconsolarcellsfollowingpostfiringthermalprocesses AT cieslaa instabilityofincreasedcontactresistanceinsiliconsolarcellsfollowingpostfiringthermalprocesses AT hallamb instabilityofincreasedcontactresistanceinsiliconsolarcellsfollowingpostfiringthermalprocesses AT payned instabilityofincreasedcontactresistanceinsiliconsolarcellsfollowingpostfiringthermalprocesses AT bonillars instabilityofincreasedcontactresistanceinsiliconsolarcellsfollowingpostfiringthermalprocesses AT wenhams instabilityofincreasedcontactresistanceinsiliconsolarcellsfollowingpostfiringthermalprocesses |