Instability of increased contact resistance in silicon solar cells following post-firing thermal processes

Recently, there have been reports of increased series resistance as a consequence of thermal processes applied after the co‐firing of screen‐printed silicon solar cells. A previous observation of this effect on very heavily diffused emitters concluded that the increased series resistance is the resu...

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Main Authors: Chan, C, Hamer, P, Bourret-Sicotte, G, Chen, R, Ciesla, A, Hallam, B, Payne, D, Bonilla, RS, Wenham, S
Format: Journal article
Language:English
Published: Wiley 2017
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author Chan, C
Hamer, P
Bourret-Sicotte, G
Chen, R
Ciesla, A
Hallam, B
Payne, D
Bonilla, RS
Wenham, S
author_facet Chan, C
Hamer, P
Bourret-Sicotte, G
Chen, R
Ciesla, A
Hallam, B
Payne, D
Bonilla, RS
Wenham, S
author_sort Chan, C
collection OXFORD
description Recently, there have been reports of increased series resistance as a consequence of thermal processes applied after the co‐firing of screen‐printed silicon solar cells. A previous observation of this effect on very heavily diffused emitters concluded that the increased series resistance is the result of a thickening of the glass layer surrounding silver crystallites at the Ag‐Si interface. Here, large increases in the front silver contact resistance after particular thermal anneals are reported that have been used to mitigate carrier‐induced degradation (CID) in multi‐crystalline solar cells that cannot be fully explained by a thickening of the glass layer. Remarkably, under certain conditions the contact resistance immediately after annealing is found to be unstable − decreasing when a forward current is applied to the solar cell, and gradually increasing again once the forward current is removed. It is speculated that the movement of charged particles, most likely hydrogen, could be the cause of this instability.
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spelling oxford-uuid:ae4822a5-b0dd-437d-9386-3d34631031072022-03-27T03:41:24ZInstability of increased contact resistance in silicon solar cells following post-firing thermal processesJournal articlehttp://purl.org/coar/resource_type/c_dcae04bcuuid:ae4822a5-b0dd-437d-9386-3d3463103107EnglishSymplectic ElementsWiley2017Chan, CHamer, PBourret-Sicotte, GChen, RCiesla, AHallam, BPayne, DBonilla, RSWenham, SRecently, there have been reports of increased series resistance as a consequence of thermal processes applied after the co‐firing of screen‐printed silicon solar cells. A previous observation of this effect on very heavily diffused emitters concluded that the increased series resistance is the result of a thickening of the glass layer surrounding silver crystallites at the Ag‐Si interface. Here, large increases in the front silver contact resistance after particular thermal anneals are reported that have been used to mitigate carrier‐induced degradation (CID) in multi‐crystalline solar cells that cannot be fully explained by a thickening of the glass layer. Remarkably, under certain conditions the contact resistance immediately after annealing is found to be unstable − decreasing when a forward current is applied to the solar cell, and gradually increasing again once the forward current is removed. It is speculated that the movement of charged particles, most likely hydrogen, could be the cause of this instability.
spellingShingle Chan, C
Hamer, P
Bourret-Sicotte, G
Chen, R
Ciesla, A
Hallam, B
Payne, D
Bonilla, RS
Wenham, S
Instability of increased contact resistance in silicon solar cells following post-firing thermal processes
title Instability of increased contact resistance in silicon solar cells following post-firing thermal processes
title_full Instability of increased contact resistance in silicon solar cells following post-firing thermal processes
title_fullStr Instability of increased contact resistance in silicon solar cells following post-firing thermal processes
title_full_unstemmed Instability of increased contact resistance in silicon solar cells following post-firing thermal processes
title_short Instability of increased contact resistance in silicon solar cells following post-firing thermal processes
title_sort instability of increased contact resistance in silicon solar cells following post firing thermal processes
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