Layer selective magnetometry in ultrathin magnetic structures by polarised neutron reflection
We discuss the application of polarised neutron reflection to layer selective vector magnetometry measurements in thin magnetic films. To illustrate the application of PNR, we review recent measurements of the absolute moment in X/Fe/Ag(001) structures with X = Pd, Ag, Au and Cu and compare the resu...
Autors principals: | Bland, J, Lee, J, Hope, S, Lauhoff, G, Penfold, J, Bucknall, D |
---|---|
Format: | Conference item |
Publicat: |
1997
|
Ítems similars
-
Magnetic anisotropy and layer-selective magnetometry of Cu/Co/Ni/Cu/Si (001)
per: Lauhoff, G, et al.
Publicat: (1999) -
Improvements to the polarised-neutron reflectometer CRISP
per: Nunez, V, et al.
Publicat: (1997) -
Interface selective vector magnetometry of FeNi/Cu/Co trilayer spin-valve structures
per: Bland, J, et al.
Publicat: (1998) -
Penetration depth of YBa2Cu3O7 measured by polarised neutron reflectometry
per: Reynolds, J, et al.
Publicat: (1998) -
Measurement of the Induced Magnetic Polarisation of Rotated-Domain Graphene Grown on Co Film with Polarised Neutron Reflectivity
per: Razan Omar M. Aboljadayel, et al.
Publicat: (2023-09-01)