Meyer, R., Kirkland, A., & Saxton, W. (2002). A new method for the determination of the wave aberration function for high resolution TEM 1. Measurement of the symmetric aberrations.
Dyfyniad Arddull ChicagoMeyer, R., A. Kirkland, and W. Saxton. A New Method for the Determination of the Wave Aberration Function for High Resolution TEM 1. Measurement of the Symmetric Aberrations. 2002.
Dyfyniad MLAMeyer, R., et al. A New Method for the Determination of the Wave Aberration Function for High Resolution TEM 1. Measurement of the Symmetric Aberrations. 2002.
Rhybudd: Mae'n bosib nad yw'r dyfyniadau hyn bob amser yn 100% cywir.