Field-ion specimen preparation using focused ion-beam milling

Field-ion specimen preparation using focused ion-beam milling

Preparation of field-ion specimens from various materials has been accomplished using focused ion-beam milling in either a simple cutting mode or by application of an annular-shaped ion-milling pattern. These specimens have been investigated using field-ion microscopy and three-dimensional atom prob...

Cur síos iomlán

Sonraí bibleagrafaíochta
Príomhchruthaitheoirí:	Larson, D, Foord, D, Petford-Long, A, Liew, H, Blamire, MG, Cerezo, A, Smith, G
Formáid:	Conference item
Foilsithe / Cruthaithe:	1999

Míreanna comhchosúla

Focused ion-beam milling for field-ion specimen preparation: preliminary investigations
de réir: Larson, D, et al.
Foilsithe / Cruthaithe: (1998)

Focused ion-beam specimen preparation for atom probe field-ion microscopy characterization of multilayer film structures
de réir: Larson, D, et al.
Foilsithe / Cruthaithe: (1999)

Sharpening of field-ion specimens and positioning of features of interest by ion-beam milling
de réir: Larson, D, et al.
Foilsithe / Cruthaithe: (2000)

Broad ion beam milling of focused ion beam prepared transmission electron microscopy cross-section specimens for high resolution electron microscopy using silicon support membranes
de réir: Langford, R, et al.
Foilsithe / Cruthaithe: (2001)

Preparation of site specific transmission electron microscopy plan-view specimens using a focused ion beam system
de réir: Langford, R, et al.
Foilsithe / Cruthaithe: (2001)

Preparation of transmission electron microscopy cross-section specimens of crack tips using focused ion beam milling
de réir: Huang, Y, et al.
Foilsithe / Cruthaithe: (2002)

Preparation of transmission electron microscopy cross-section specimens of crack tips using focused ion beam milling.
de réir: Huang, Y, et al.
Foilsithe / Cruthaithe: (2002)

INSITU ION MILLING OF FIELD-ION SPECIMENS USING A LIQUID-METAL ION-SOURCE
de réir: Waugh, A, et al.
Foilsithe / Cruthaithe: (1984)

Three-dimensional atom probe field-ion microscopy observation of Cu/Co multilayer film structures
de réir: Larson, D, et al.
Foilsithe / Cruthaithe: (1998)

An in-situ approach for preparing atom probe tomography specimens by xenon plasma-focused ion beam
de réir: Halpin, J, et al.
Foilsithe / Cruthaithe: (2019)

FRACTURE OF FIELD-ION MICROSCOPE SPECIMENS
de réir: Wilkes, T, et al.
Foilsithe / Cruthaithe: (1972)

Self-organized amorphous material in silicon(001) by focused ion beam (FIB) system
de réir: Huang, Y, et al.
Foilsithe / Cruthaithe: (2005)

Focused Ion Beam Microfabrication
de réir: Melngailis, John, et al.
Foilsithe / Cruthaithe: (2010)

Preparation of site specific transmission electron microscopy plan-view specimens using a focused ion beam system
de réir: Langford, R, et al.
Foilsithe / Cruthaithe: (2001)

Focused Ion Beam Microfabrication
de réir: Melngailis, John, et al.
Foilsithe / Cruthaithe: (2010)

Focused Ion Beam Fabrication
de réir: Melngailis, John, et al.
Foilsithe / Cruthaithe: (2010)

Focused Ion Beam Fabrication
de réir: Lezec, Henri J., et al.
Foilsithe / Cruthaithe: (2010)

Focused Ion Beam Fabrication
de réir: Melngailis, John, et al.
Foilsithe / Cruthaithe: (2010)

Focused Ion Beam Fabrication
de réir: Melngailis, John, et al.
Foilsithe / Cruthaithe: (2010)

Focused Ion Beam Fabrication
de réir: Musil, Christian, et al.
Foilsithe / Cruthaithe: (2010)

Focused Ion Beam Fabrication
de réir: Melngailis, John, et al.
Foilsithe / Cruthaithe: (2010)

Fabrication of 3D microstructures using focused ion beam milling
de réir: Loo, Yee Wei.
Foilsithe / Cruthaithe: (2008)

Focused Ion Beam Fabrication
de réir: Melngailis, John, et al.
Foilsithe / Cruthaithe: (2010)

Focused ion beam fabrication of boron-doped diamond ultramicroelectrodes.
de réir: Hu, J, et al.
Foilsithe / Cruthaithe: (2009)

Nanoscale residual stress depth profiling by focused ion beam milling and eigenstrain analysis
de réir: Korsunsky, A, et al.
Foilsithe / Cruthaithe: (2018)

Generalised residual stress depth profiling at the nanoscale using focused ion beam milling
de réir: Salvati, E, et al.
Foilsithe / Cruthaithe: (2019)

Focused ion beam induced deposition of copper
de réir: Della Ratta, Anthony D. (Anthony David)
Foilsithe / Cruthaithe: (2005)

Xenon plasma focused ion beam lamella fabrication on high-pressure frozen specimens for structural cell biology
de réir: Berger, C, et al.
Foilsithe / Cruthaithe: (2025)

Characterization of ionic liquid ion sources for focused ion beam applications
de réir: Perez Martinez, Carla S. (Carla Sofia)
Foilsithe / Cruthaithe: (2013)

A review of focused ion beam sputtering
de réir: Ali, Mohammad Yeakub, et al.
Foilsithe / Cruthaithe: (2010)

Focused ion beam assisted deposition of gold
de réir: Shedd, Gordon M.
Foilsithe / Cruthaithe: (2005)

Focused ion beam systems : basics and applications /
de réir: Yao, Nan
Foilsithe / Cruthaithe: (2007)

Focused ion beam four-slot milling for Poisson's ratio and residual stress evaluation at the micron scale
de réir: Sebastiani, M, et al.
Foilsithe / Cruthaithe: (2014)

Focused ion beam four-slot milling for Poisson's ratio and residual stress evaluation at the micron scale
de réir: Sebastiani, M, et al.
Foilsithe / Cruthaithe: (2014)

Optical cavity efficacy and lasing of focused ion beam milled GaN/InGaN micropillars
de réir: El-Ella, H, et al.
Foilsithe / Cruthaithe: (2012)

Laser linking of metal interconnect : process considerations and failure analysis using focused ion beam milling
de réir: Rasera, Roy L. (Roy Louis)
Foilsithe / Cruthaithe: (2006)

Digital Image Correlation for Elastic Strain Evaluation during Focused Ion Beam Ring-Core Milling
de réir: Uzun, F, et al.
Foilsithe / Cruthaithe: (2024)

Fabrication of Bio-MEMS Nanostructure by focused ion beam
de réir: Ali, Mohammad Yeakub, et al.
Foilsithe / Cruthaithe: (2010)

Investigation of Microholes Produced by Focused Ion Beam Micromachining
de réir: Mohd. Fuad, Nurul Hajar, et al.
Foilsithe / Cruthaithe: (2010)

Investigation of microholes produced by focused ion beam micromachining
de réir: Mohd Fuad, Nurul Hajar, et al.
Foilsithe / Cruthaithe: (2011)