Field-ion specimen preparation using focused ion-beam milling
Preparation of field-ion specimens from various materials has been accomplished using focused ion-beam milling in either a simple cutting mode or by application of an annular-shaped ion-milling pattern. These specimens have been investigated using field-ion microscopy and three-dimensional atom prob...
| Κύριοι συγγραφείς: | , , , , , , |
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| Μορφή: | Conference item |
| Έκδοση: |
1999
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