3D focused ion beam sectioning of zirconium oxides in Zircaloy-4 for the characterisation of cracking
Sequential 2D sectioning and imaging using a dual-beam focused ion beam and scanning electron microscope has been used to characterise the interconnectivity of cracks in oxide films on Zircaloy-4. Evidence of cracks perpendicular to the metal/oxide interface have been observed in multiple oxides of...
| Những tác giả chính: | , , , , |
|---|---|
| Định dạng: | Journal article |
| Ngôn ngữ: | English |
| Được phát hành: |
Elsevier
2020
|