3D focused ion beam sectioning of zirconium oxides in Zircaloy-4 for the characterisation of cracking
Sequential 2D sectioning and imaging using a dual-beam focused ion beam and scanning electron microscope has been used to characterise the interconnectivity of cracks in oxide films on Zircaloy-4. Evidence of cracks perpendicular to the metal/oxide interface have been observed in multiple oxides of...
| Egile Nagusiak: | , , , , |
|---|---|
| Formatua: | Journal article |
| Hizkuntza: | English |
| Argitaratua: |
Elsevier
2020
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