3D focused ion beam sectioning of zirconium oxides in Zircaloy-4 for the characterisation of cracking

Sequential 2D sectioning and imaging using a dual-beam focused ion beam and scanning electron microscope has been used to characterise the interconnectivity of cracks in oxide films on Zircaloy-4. Evidence of cracks perpendicular to the metal/oxide interface have been observed in multiple oxides of...

詳細記述

書誌詳細
主要な著者: Weekes, HE, Ortner, S, Qaisar, A, Lozano-Perez, S, Jurkschat, K
フォーマット: Journal article
言語:English
出版事項: Elsevier 2020