ELECTRON CHANNELING CONTRAST IMAGING (ECCI) OF DISLOCATIONS IN BULK SPECIMENS

ELECTRON CHANNELING CONTRAST IMAGING (ECCI) OF DISLOCATIONS IN BULK SPECIMENS

Sonraí bibleagrafaíochta
Príomhchruthaitheoirí:	Czernuszka, J, Long, N, Boyes, E, Hirsch, P
Formáid:	Conference item
Foilsithe / Cruthaithe:	1991

Míreanna comhchosúla

Characterizing dislocation structures in bulk fatigued copper single crystals using electron channelling contrast imaging (ECCI)
de réir: Ahmed, J, et al.
Foilsithe / Cruthaithe: (1997)

Study of dislocation structures near fatigue cracks using electron channelling contrast imaging technique (ECCI).
de réir: Ahmed, J, et al.
Foilsithe / Cruthaithe: (1999)

ANALYSIS OF DEFECTS IN BULK SEMICONDUCTORS USING ELECTRON CHANNELING CONTRAST IMAGING
de réir: Czernuszka, J, et al.
Foilsithe / Cruthaithe: (1991)

ANALYSIS OF DEFECTS IN BULK SEMICONDUCTORS USING ELECTRON CHANNELING CONTRAST IMAGING
de réir: Czernuszka, J, et al.
Foilsithe / Cruthaithe: (1991)

Effects of surface relaxation on electron channelling contrast images of misfit dislocations
de réir: Wilkinson, A, et al.
Foilsithe / Cruthaithe: (1994)

Electron Channeling Contrast Imaging (ECCI) of Ion Battery Cathode Materials
de réir: Naghizadeh Meysam, et al.
Foilsithe / Cruthaithe: (2024-01-01)

IMAGING OF DISLOCATIONS USING BACKSCATTERED ELECTRONS IN A SCANNING ELECTRON-MICROSCOPE
de réir: Czernuszka, J, et al.
Foilsithe / Cruthaithe: (1990)

OpenECCI - A Streamlined Open-Source Workflow for Electron Channelling Contrast Imaging of Crystal Defects
de réir: Xu Zhou, et al.
Foilsithe / Cruthaithe: (2024-01-01)

ELECTRON CHANNELING CONTRAST IMAGING OF DEFECTS IN SEMICONDUCTORS
de réir: Wilkinson, A, et al.
Foilsithe / Cruthaithe: (1993)

Multiple scattering simulation of electron channelling contrast images of dislocations at interfaces
de réir: Dudarev, S, et al.
Foilsithe / Cruthaithe: (1995)

THE EFFECTS OF SURFACE STRESS-RELAXATION ON ELECTRON CHANNELING CONTRAST IMAGES OF DISLOCATIONS
de réir: Wilkinson, A, et al.
Foilsithe / Cruthaithe: (1995)

ELECTRON CHANNELING CONTRAST IMAGING OF INTERFACIAL DEFECTS IN STRAINED SILICON-GERMANIUM LAYERS ON SILICON
de réir: Wilkinson, A, et al.
Foilsithe / Cruthaithe: (1993)

Electron channelling contrast imaging of dislocation substructures in the vicinity of short fatigue cracks in Cu
de réir: Ahmed, J, et al.
Foilsithe / Cruthaithe: (1998)

Electron channeling and ion channeling contrast imaging of dislocations in nitride thin films
de réir: Trager-Cowan, C, et al.
Foilsithe / Cruthaithe: (2008)

Electron backscatter diffraction and electron channeling contrast imaging of tilt and dislocations in nitride thin films
de réir: Trager-Cowan, C, et al.
Foilsithe / Cruthaithe: (2007)

Examination of dislocation substructures in fatigued Cu using electron channelling contrast imaging
de réir: Ahmed, J, et al.
Foilsithe / Cruthaithe: (1999)

Visualization of dislocations through electron channeling contrast imaging at fatigue crack tip, interacting with pre-existing dislocations
de réir: Kishan Habib, et al.
Foilsithe / Cruthaithe: (2018-01-01)

REFLECTION ELECTRON-MICROSCOPY OBSERVATIONS OF DISLOCATIONS AND DISLOCATION-MOTION IN ZINC-OXIDE
de réir: Peng, L, et al.
Foilsithe / Cruthaithe: (1991)

Characterizing dislocation structure evolution during cyclic deformation using electron channelling contrast imaging
de réir: Ahmed, J, et al.
Foilsithe / Cruthaithe: (2006)

CATHODOLUMINESCENCE-MODE IMAGING OF DISLOCATIONS IN ZINC-OXIDE
de réir: Czernuszka, J, et al.
Foilsithe / Cruthaithe: (1990)

Satisfação dos clientes com os cuidados de enfermagem de uma ECCI
de réir: Deolinda Bernardo, et al.
Foilsithe / Cruthaithe: (2023-01-01)

New perspectives on collision cascade damage in self-ion irradiated tungsten from HR-EBSD and ECCI
de réir: Yu, H, et al.
Foilsithe / Cruthaithe: (2021)

Simulations of electron diffraction contrast images of nanometer-sized dislocation loops
de réir: Zhou, Z, et al.
Foilsithe / Cruthaithe: (2004)

Electron channelling contrast imaging characterization of dislocation structures associated with extrusion and intrusion systems and fatigue cracks in copper single crystals
de réir: Ahmed, J, et al.
Foilsithe / Cruthaithe: (2001)

ECCI AND USSR OFFICIAL RADIO BROADCASTING TO FRANCO’S SPAIN DURING EARLY PART OF WORLD WAR II
de réir: A A Glazov
Foilsithe / Cruthaithe: (2016-12-01)

Decoherence in electron backscattering by kinked dislocations.
de réir: Dudarev, S, et al.
Foilsithe / Cruthaithe: (1999)

Decoherence in electron backscattering by kinked dislocations
de réir: Dudarev, S, et al.
Foilsithe / Cruthaithe: (1999)

TEM diffraction contrast images simulation of dislocations
de réir: WU, W., et al.
Foilsithe / Cruthaithe: (2022)

TEM diffraction contrast images simulation of dislocations
de réir: WU, W., et al.
Foilsithe / Cruthaithe: (2022)

EFFECT OF SURFACE-CHARGE ON THE DISLOCATION MOBILITY IN SEMICONDUCTORS
de réir: Czernuszka, J
Foilsithe / Cruthaithe: (1989)

EFFECT OF SURFACE-CHARGE ON THE DISLOCATION MOBILITY IN SEMICONDUCTORS
de réir: Czernuszka, J
Foilsithe / Cruthaithe: (1989)

On the assessment of creep damage evolution in nickel-based superalloys through correlative HR-EBSD and cECCI studies
de réir: Sulzer, S, et al.
Foilsithe / Cruthaithe: (2019)

Consensus recommendation for prenatal, neonatal and postnatal management of congenital cytomegalovirus infection from the European congenital infection initiative (ECCI)
de réir: Marianne Leruez-Ville, et al.
Foilsithe / Cruthaithe: (2024-05-01)

Determination of Bulk Volume of Asphalt Specimens with Image-based Modeling
de réir: Eyal Levenberg, et al.
Foilsithe / Cruthaithe: (2013-03-01)

Cross-correlation based high resolution electron backscatter diffraction and electron channelling contrast imaging for strain mapping and dislocation distributions in InAlN thin films
de réir: Wilkinson, A, et al.
Foilsithe / Cruthaithe: (2016)

The eCare Client Impact Survey (eCCIS) - Developing a new Tool for assessing Client Impacts of Telehealthcare
de réir: Sarah Delaney, et al.
Foilsithe / Cruthaithe: (2013-11-01)

ELECTRON-IRRADIATION INDUCED VITRIFICATION AT DISLOCATIONS IN QUARTZ
de réir: Cherns, D, et al.
Foilsithe / Cruthaithe: (1980)

THE STRUCTURE OF DISLOCATIONS IN QUARTZ UNDER ELECTRON-IRRADIATION
de réir: Cherns, D, et al.
Foilsithe / Cruthaithe: (1980)

Nanoscale imaging of the full strain tensor of specific dislocations extracted from a bulk sample
de réir: Hofmann, F, et al.
Foilsithe / Cruthaithe: (2020)

Characterization of nitride thin films by electron backscatter diffraction and electron channeling contrast imaging
de réir: Trager-Cowan, C, et al.
Foilsithe / Cruthaithe: (2006)