ELECTRON CHANNELING CONTRAST IMAGING (ECCI) OF DISLOCATIONS IN BULK SPECIMENS

ELECTRON CHANNELING CONTRAST IMAGING (ECCI) OF DISLOCATIONS IN BULK SPECIMENS

Xehetasun bibliografikoak
Egile Nagusiak:	Czernuszka, J, Long, N, Boyes, E, Hirsch, P
Formatua:	Conference item
Argitaratua:	1991

Antzeko izenburuak

Characterizing dislocation structures in bulk fatigued copper single crystals using electron channelling contrast imaging (ECCI)
nork: Ahmed, J, et al.
Argitaratua: (1997)

Study of dislocation structures near fatigue cracks using electron channelling contrast imaging technique (ECCI).
nork: Ahmed, J, et al.
Argitaratua: (1999)

ANALYSIS OF DEFECTS IN BULK SEMICONDUCTORS USING ELECTRON CHANNELING CONTRAST IMAGING
nork: Czernuszka, J, et al.
Argitaratua: (1991)

ANALYSIS OF DEFECTS IN BULK SEMICONDUCTORS USING ELECTRON CHANNELING CONTRAST IMAGING
nork: Czernuszka, J, et al.
Argitaratua: (1991)

Effects of surface relaxation on electron channelling contrast images of misfit dislocations
nork: Wilkinson, A, et al.
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Electron Channeling Contrast Imaging (ECCI) of Ion Battery Cathode Materials
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IMAGING OF DISLOCATIONS USING BACKSCATTERED ELECTRONS IN A SCANNING ELECTRON-MICROSCOPE
nork: Czernuszka, J, et al.
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OpenECCI - A Streamlined Open-Source Workflow for Electron Channelling Contrast Imaging of Crystal Defects
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ELECTRON CHANNELING CONTRAST IMAGING OF DEFECTS IN SEMICONDUCTORS
nork: Wilkinson, A, et al.
Argitaratua: (1993)

Multiple scattering simulation of electron channelling contrast images of dislocations at interfaces
nork: Dudarev, S, et al.
Argitaratua: (1995)

THE EFFECTS OF SURFACE STRESS-RELAXATION ON ELECTRON CHANNELING CONTRAST IMAGES OF DISLOCATIONS
nork: Wilkinson, A, et al.
Argitaratua: (1995)

ELECTRON CHANNELING CONTRAST IMAGING OF INTERFACIAL DEFECTS IN STRAINED SILICON-GERMANIUM LAYERS ON SILICON
nork: Wilkinson, A, et al.
Argitaratua: (1993)

Electron channelling contrast imaging of dislocation substructures in the vicinity of short fatigue cracks in Cu
nork: Ahmed, J, et al.
Argitaratua: (1998)

Electron channeling and ion channeling contrast imaging of dislocations in nitride thin films
nork: Trager-Cowan, C, et al.
Argitaratua: (2008)

Electron backscatter diffraction and electron channeling contrast imaging of tilt and dislocations in nitride thin films
nork: Trager-Cowan, C, et al.
Argitaratua: (2007)

Examination of dislocation substructures in fatigued Cu using electron channelling contrast imaging
nork: Ahmed, J, et al.
Argitaratua: (1999)

Visualization of dislocations through electron channeling contrast imaging at fatigue crack tip, interacting with pre-existing dislocations
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Argitaratua: (2018-01-01)

REFLECTION ELECTRON-MICROSCOPY OBSERVATIONS OF DISLOCATIONS AND DISLOCATION-MOTION IN ZINC-OXIDE
nork: Peng, L, et al.
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Characterizing dislocation structure evolution during cyclic deformation using electron channelling contrast imaging
nork: Ahmed, J, et al.
Argitaratua: (2006)

CATHODOLUMINESCENCE-MODE IMAGING OF DISLOCATIONS IN ZINC-OXIDE
nork: Czernuszka, J, et al.
Argitaratua: (1990)

Satisfação dos clientes com os cuidados de enfermagem de uma ECCI
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New perspectives on collision cascade damage in self-ion irradiated tungsten from HR-EBSD and ECCI
nork: Yu, H, et al.
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Simulations of electron diffraction contrast images of nanometer-sized dislocation loops
nork: Zhou, Z, et al.
Argitaratua: (2004)

Electron channelling contrast imaging characterization of dislocation structures associated with extrusion and intrusion systems and fatigue cracks in copper single crystals
nork: Ahmed, J, et al.
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ECCI AND USSR OFFICIAL RADIO BROADCASTING TO FRANCO’S SPAIN DURING EARLY PART OF WORLD WAR II
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Decoherence in electron backscattering by kinked dislocations.
nork: Dudarev, S, et al.
Argitaratua: (1999)

Decoherence in electron backscattering by kinked dislocations
nork: Dudarev, S, et al.
Argitaratua: (1999)

TEM diffraction contrast images simulation of dislocations
nork: WU, W., et al.
Argitaratua: (2022)

TEM diffraction contrast images simulation of dislocations
nork: WU, W., et al.
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EFFECT OF SURFACE-CHARGE ON THE DISLOCATION MOBILITY IN SEMICONDUCTORS
nork: Czernuszka, J
Argitaratua: (1989)

EFFECT OF SURFACE-CHARGE ON THE DISLOCATION MOBILITY IN SEMICONDUCTORS
nork: Czernuszka, J
Argitaratua: (1989)

On the assessment of creep damage evolution in nickel-based superalloys through correlative HR-EBSD and cECCI studies
nork: Sulzer, S, et al.
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Consensus recommendation for prenatal, neonatal and postnatal management of congenital cytomegalovirus infection from the European congenital infection initiative (ECCI)
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Determination of Bulk Volume of Asphalt Specimens with Image-based Modeling
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Cross-correlation based high resolution electron backscatter diffraction and electron channelling contrast imaging for strain mapping and dislocation distributions in InAlN thin films
nork: Wilkinson, A, et al.
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The eCare Client Impact Survey (eCCIS) - Developing a new Tool for assessing Client Impacts of Telehealthcare
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ELECTRON-IRRADIATION INDUCED VITRIFICATION AT DISLOCATIONS IN QUARTZ
nork: Cherns, D, et al.
Argitaratua: (1980)

THE STRUCTURE OF DISLOCATIONS IN QUARTZ UNDER ELECTRON-IRRADIATION
nork: Cherns, D, et al.
Argitaratua: (1980)

Nanoscale imaging of the full strain tensor of specific dislocations extracted from a bulk sample
nork: Hofmann, F, et al.
Argitaratua: (2020)

Characterization of nitride thin films by electron backscatter diffraction and electron channeling contrast imaging
nork: Trager-Cowan, C, et al.
Argitaratua: (2006)