ELECTRON CHANNELING CONTRAST IMAGING (ECCI) OF DISLOCATIONS IN BULK SPECIMENS

ELECTRON CHANNELING CONTRAST IMAGING (ECCI) OF DISLOCATIONS IN BULK SPECIMENS

ग्रंथसूची विवरण
मुख्य लेखकों:	Czernuszka, J, Long, N, Boyes, E, Hirsch, P
स्वरूप:	Conference item
प्रकाशित:	1991

समान संसाधन

Characterizing dislocation structures in bulk fatigued copper single crystals using electron channelling contrast imaging (ECCI)
द्वारा: Ahmed, J, और अन्य
प्रकाशित: (1997)

ANALYSIS OF DEFECTS IN BULK SEMICONDUCTORS USING ELECTRON CHANNELING CONTRAST IMAGING
द्वारा: Czernuszka, J, और अन्य
प्रकाशित: (1991)

ANALYSIS OF DEFECTS IN BULK SEMICONDUCTORS USING ELECTRON CHANNELING CONTRAST IMAGING
द्वारा: Czernuszka, J, और अन्य
प्रकाशित: (1991)

Study of dislocation structures near fatigue cracks using electron channelling contrast imaging technique (ECCI).
द्वारा: Ahmed, J, और अन्य
प्रकाशित: (1999)

Effects of surface relaxation on electron channelling contrast images of misfit dislocations
द्वारा: Wilkinson, A, और अन्य
प्रकाशित: (1994)

IMAGING OF DISLOCATIONS USING BACKSCATTERED ELECTRONS IN A SCANNING ELECTRON-MICROSCOPE
द्वारा: Czernuszka, J, और अन्य
प्रकाशित: (1990)

ELECTRON CHANNELING CONTRAST IMAGING OF DEFECTS IN SEMICONDUCTORS
द्वारा: Wilkinson, A, और अन्य
प्रकाशित: (1993)

THE EFFECTS OF SURFACE STRESS-RELAXATION ON ELECTRON CHANNELING CONTRAST IMAGES OF DISLOCATIONS
द्वारा: Wilkinson, A, और अन्य
प्रकाशित: (1995)

Multiple scattering simulation of electron channelling contrast images of dislocations at interfaces
द्वारा: Dudarev, S, और अन्य
प्रकाशित: (1995)

Electron channelling contrast imaging of dislocation substructures in the vicinity of short fatigue cracks in Cu
द्वारा: Ahmed, J, और अन्य
प्रकाशित: (1998)

ELECTRON CHANNELING CONTRAST IMAGING OF INTERFACIAL DEFECTS IN STRAINED SILICON-GERMANIUM LAYERS ON SILICON
द्वारा: Wilkinson, A, और अन्य
प्रकाशित: (1993)

Electron channeling and ion channeling contrast imaging of dislocations in nitride thin films
द्वारा: Trager-Cowan, C, और अन्य
प्रकाशित: (2008)

Examination of dislocation substructures in fatigued Cu using electron channelling contrast imaging
द्वारा: Ahmed, J, और अन्य
प्रकाशित: (1999)

Electron backscatter diffraction and electron channeling contrast imaging of tilt and dislocations in nitride thin films
द्वारा: Trager-Cowan, C, और अन्य
प्रकाशित: (2007)

Characterizing dislocation structure evolution during cyclic deformation using electron channelling contrast imaging
द्वारा: Ahmed, J, और अन्य
प्रकाशित: (2006)

Simulations of electron diffraction contrast images of nanometer-sized dislocation loops
द्वारा: Zhou, Z, और अन्य
प्रकाशित: (2004)

REFLECTION ELECTRON-MICROSCOPY OBSERVATIONS OF DISLOCATIONS AND DISLOCATION-MOTION IN ZINC-OXIDE
द्वारा: Peng, L, और अन्य
प्रकाशित: (1991)

TEM diffraction contrast images simulation of dislocations
द्वारा: WU, W., और अन्य
प्रकाशित: (2022)

TEM diffraction contrast images simulation of dislocations
द्वारा: WU, W., और अन्य
प्रकाशित: (2022)

CATHODOLUMINESCENCE-MODE IMAGING OF DISLOCATIONS IN ZINC-OXIDE
द्वारा: Czernuszka, J, और अन्य
प्रकाशित: (1990)

Electron channelling contrast imaging characterization of dislocation structures associated with extrusion and intrusion systems and fatigue cracks in copper single crystals
द्वारा: Ahmed, J, और अन्य
प्रकाशित: (2001)

Decoherence in electron backscattering by kinked dislocations.
द्वारा: Dudarev, S, और अन्य
प्रकाशित: (1999)

Decoherence in electron backscattering by kinked dislocations
द्वारा: Dudarev, S, और अन्य
प्रकाशित: (1999)

BACKSCATTERED ELECTRON COMPOSITIONAL ANALYSIS OF INTERFACES IN BULK SPECIMENS USING A DECONVOLUTION TECHNIQUE
द्वारा: Wilshaw, P, और अन्य
प्रकाशित: (1991)

BACKSCATTERED ELECTRON COMPOSITIONAL ANALYSIS OF INTERFACES IN BULK SPECIMENS USING A DECONVOLUTION TECHNIQUE
द्वारा: Wilshaw, P, और अन्य
प्रकाशित: (1991)

Characterization of nitride thin films by electron backscatter diffraction and electron channeling contrast imaging
द्वारा: Trager-Cowan, C, और अन्य
प्रकाशित: (2006)

Characterisation of nitride thin films by electron backscatter diffraction and electron channelling contrast imaging
द्वारा: Trager-Cowan, C, और अन्य
प्रकाशित: (2006)

Cross-correlation based high resolution electron backscatter diffraction and electron channelling contrast imaging for strain mapping and dislocation distributions in InAlN thin films
द्वारा: Wilkinson, A, और अन्य
प्रकाशित: (2016)

ELECTRON-IRRADIATION INDUCED VITRIFICATION AT DISLOCATIONS IN QUARTZ
द्वारा: Cherns, D, और अन्य
प्रकाशित: (1980)

THE STRUCTURE OF DISLOCATIONS IN QUARTZ UNDER ELECTRON-IRRADIATION
द्वारा: Cherns, D, और अन्य
प्रकाशित: (1980)

Electron diffraction based techniques in scanning electron microscopy of bulk materials
द्वारा: Wilkinson, A, और अन्य
प्रकाशित: (1998)

Electron diffraction based techniques in scanning electron microscopy of bulk materials
द्वारा: Wilkinson, A, और अन्य
प्रकाशित: (1997)

Nanoscale imaging of the full strain tensor of specific dislocations extracted from a bulk sample
द्वारा: Hofmann, F, और अन्य
प्रकाशित: (2020)

New perspectives on collision cascade damage in self-ion irradiated tungsten from HR-EBSD and ECCI
द्वारा: Yu, H, और अन्य
प्रकाशित: (2021)

ADF STEM imaging of screw dislocations viewed end-on
द्वारा: Cosgriff, E, और अन्य
प्रकाशित: (2010)

DISLOCATION RECOMBINATION THEORY FOR SILICON AND INTERPRETATION OF EBIC CONTRAST IN TERMS OF FUNDAMENTAL DISLOCATION PARAMETERS.
द्वारा: Wilshaw, P, और अन्य
प्रकाशित: (1986)

DECONVOLUTION METHOD TO OBTAIN COMPOSITION PROFILES FROM SEM BACKSCATTERED ELECTRON SIGNAL PROFILES FOR BULK SPECIMENS
द्वारा: Konkol, A, और अन्य
प्रकाशित: (1994)

Nanoscale imaging of the full strain tensor of specific dislocations extracted from a bulk sample
द्वारा: Hofmann, F, और अन्य
प्रकाशित: (2019)

Synergistic effects of anisotropy and image force on TEM diffraction contrast of dislocation loops
द्वारा: WU, W., और अन्य
प्रकाशित: (2022)

MEASUREMENT OF CONTRAST FROM INDIVIDUAL DISLOCATIONS BY LOCK-IN EBIC
द्वारा: Ourmazd, A, और अन्य
प्रकाशित: (1982)