ELECTRON CHANNELING CONTRAST IMAGING (ECCI) OF DISLOCATIONS IN BULK SPECIMENS
Main Authors: | Czernuszka, J, Long, N, Boyes, E, Hirsch, P |
---|---|
格式: | Conference item |
出版: |
1991
|
相似書籍
-
Characterizing dislocation structures in bulk fatigued copper single crystals using electron channelling contrast imaging (ECCI)
由: Ahmed, J, et al.
出版: (1997) -
Study of dislocation structures near fatigue cracks using electron channelling contrast imaging technique (ECCI).
由: Ahmed, J, et al.
出版: (1999) -
ANALYSIS OF DEFECTS IN BULK SEMICONDUCTORS USING ELECTRON CHANNELING CONTRAST IMAGING
由: Czernuszka, J, et al.
出版: (1991) -
ANALYSIS OF DEFECTS IN BULK SEMICONDUCTORS USING ELECTRON CHANNELING CONTRAST IMAGING
由: Czernuszka, J, et al.
出版: (1991) -
Effects of surface relaxation on electron channelling contrast images of misfit dislocations
由: Wilkinson, A, et al.
出版: (1994)