ELECTRON CHANNELING CONTRAST IMAGING (ECCI) OF DISLOCATIONS IN BULK SPECIMENS

Míreanna comhchosúla

• Characterizing dislocation structures in bulk fatigued copper single crystals using electron channelling contrast imaging (ECCI)
  de réir: Ahmed, J, et al.
  Foilsithe / Cruthaithe: (1997)
• Study of dislocation structures near fatigue cracks using electron channelling contrast imaging technique (ECCI).
  de réir: Ahmed, J, et al.
  Foilsithe / Cruthaithe: (1999)
• ANALYSIS OF DEFECTS IN BULK SEMICONDUCTORS USING ELECTRON CHANNELING CONTRAST IMAGING
  de réir: Czernuszka, J, et al.
  Foilsithe / Cruthaithe: (1991)
• ANALYSIS OF DEFECTS IN BULK SEMICONDUCTORS USING ELECTRON CHANNELING CONTRAST IMAGING
  de réir: Czernuszka, J, et al.
  Foilsithe / Cruthaithe: (1991)
• Effects of surface relaxation on electron channelling contrast images of misfit dislocations
  de réir: Wilkinson, A, et al.
  Foilsithe / Cruthaithe: (1994)