ELECTRON CHANNELING CONTRAST IMAGING (ECCI) OF DISLOCATIONS IN BULK SPECIMENS

समान संसाधन

• Characterizing dislocation structures in bulk fatigued copper single crystals using electron channelling contrast imaging (ECCI)
  द्वारा: Ahmed, J, और अन्य
  प्रकाशित: (1997)
• Study of dislocation structures near fatigue cracks using electron channelling contrast imaging technique (ECCI).
  द्वारा: Ahmed, J, और अन्य
  प्रकाशित: (1999)
• ANALYSIS OF DEFECTS IN BULK SEMICONDUCTORS USING ELECTRON CHANNELING CONTRAST IMAGING
  द्वारा: Czernuszka, J, और अन्य
  प्रकाशित: (1991)
• ANALYSIS OF DEFECTS IN BULK SEMICONDUCTORS USING ELECTRON CHANNELING CONTRAST IMAGING
  द्वारा: Czernuszka, J, और अन्य
  प्रकाशित: (1991)
• Effects of surface relaxation on electron channelling contrast images of misfit dislocations
  द्वारा: Wilkinson, A, और अन्य
  प्रकाशित: (1994)