Cita APA (7th ed.)

Czernuszka, J., Long, N., & Hirsch, P. (1991). ANALYSIS OF DEFECTS IN BULK SEMICONDUCTORS USING ELECTRON CHANNELING CONTRAST IMAGING. Publ by Inst of Physics Publ Ltd.

Cita Chicago (17th ed.)

Czernuszka, J., N. Long, i P. Hirsch. ANALYSIS OF DEFECTS IN BULK SEMICONDUCTORS USING ELECTRON CHANNELING CONTRAST IMAGING. Publ by Inst of Physics Publ Ltd, 1991.

Cita MLA (9th ed.)

Czernuszka, J., et al. ANALYSIS OF DEFECTS IN BULK SEMICONDUCTORS USING ELECTRON CHANNELING CONTRAST IMAGING. Publ by Inst of Physics Publ Ltd, 1991.