Czernuszka, J., Long, N., & Hirsch, P. (1991). ANALYSIS OF DEFECTS IN BULK SEMICONDUCTORS USING ELECTRON CHANNELING CONTRAST IMAGING. Publ by Inst of Physics Publ Ltd.
Chicago-Zitierstil (17. Ausg.)Czernuszka, J., N. Long, und P. Hirsch. ANALYSIS OF DEFECTS IN BULK SEMICONDUCTORS USING ELECTRON CHANNELING CONTRAST IMAGING. Publ by Inst of Physics Publ Ltd, 1991.
MLA-Zitierstil (9. Ausg.)Czernuszka, J., et al. ANALYSIS OF DEFECTS IN BULK SEMICONDUCTORS USING ELECTRON CHANNELING CONTRAST IMAGING. Publ by Inst of Physics Publ Ltd, 1991.
Achtung: Diese Zitate sind unter Umständen nicht zu 100% korrekt.