Czernuszka, J., Long, N., & Hirsch, P. (1991). ANALYSIS OF DEFECTS IN BULK SEMICONDUCTORS USING ELECTRON CHANNELING CONTRAST IMAGING. Publ by Inst of Physics Publ Ltd.
Chicago-referens (17:e uppl.)Czernuszka, J., N. Long, och P. Hirsch. ANALYSIS OF DEFECTS IN BULK SEMICONDUCTORS USING ELECTRON CHANNELING CONTRAST IMAGING. Publ by Inst of Physics Publ Ltd, 1991.
MLA-referens (9:e uppl.)Czernuszka, J., et al. ANALYSIS OF DEFECTS IN BULK SEMICONDUCTORS USING ELECTRON CHANNELING CONTRAST IMAGING. Publ by Inst of Physics Publ Ltd, 1991.
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