APA引文

Czernuszka, J., Long, N., & Hirsch, P. (1991). ANALYSIS OF DEFECTS IN BULK SEMICONDUCTORS USING ELECTRON CHANNELING CONTRAST IMAGING. Publ by Inst of Physics Publ Ltd.

Chicago Style (17th ed.) Citation

Czernuszka, J., N. Long, and P. Hirsch. ANALYSIS OF DEFECTS IN BULK SEMICONDUCTORS USING ELECTRON CHANNELING CONTRAST IMAGING. Publ by Inst of Physics Publ Ltd, 1991.

MLA引文

Czernuszka, J., et al. ANALYSIS OF DEFECTS IN BULK SEMICONDUCTORS USING ELECTRON CHANNELING CONTRAST IMAGING. Publ by Inst of Physics Publ Ltd, 1991.