Czernuszka, J., Long, N., & Hirsch, P. (1991). ANALYSIS OF DEFECTS IN BULK SEMICONDUCTORS USING ELECTRON CHANNELING CONTRAST IMAGING. Publ by Inst of Physics Publ Ltd.
芝加哥风格引文Czernuszka, J., N. Long, 与 P. Hirsch. ANALYSIS OF DEFECTS IN BULK SEMICONDUCTORS USING ELECTRON CHANNELING CONTRAST IMAGING. Publ by Inst of Physics Publ Ltd, 1991.
MLA引文Czernuszka, J., et al. ANALYSIS OF DEFECTS IN BULK SEMICONDUCTORS USING ELECTRON CHANNELING CONTRAST IMAGING. Publ by Inst of Physics Publ Ltd, 1991.
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