ANALYSIS OF DEFECTS IN BULK SEMICONDUCTORS USING ELECTRON CHANNELING CONTRAST IMAGING

ANALYSIS OF DEFECTS IN BULK SEMICONDUCTORS USING ELECTRON CHANNELING CONTRAST IMAGING

Afficher d'autres versions (1)

Electron channelling contrast imaging (ECCI) is a SEM based technique for imaging and characterising the Burgers vectors of dislocations in bulk samples. Thus, thin foil relaxation effects do not occur and specimen preparation is relatively straightforward. In this paper we present preliminary resul...

Description complète

Détails bibliographiques
Auteurs principaux:	Czernuszka, J, Long, N, Hirsch, P
Format:	Conference item
Publié:	Publ by Inst of Physics Publ Ltd 1991

Documents similaires

ANALYSIS OF DEFECTS IN BULK SEMICONDUCTORS USING ELECTRON CHANNELING CONTRAST IMAGING
par: Czernuszka, J, et autres
Publié: (1991)

ELECTRON CHANNELING CONTRAST IMAGING OF DEFECTS IN SEMICONDUCTORS
par: Wilkinson, A, et autres
Publié: (1993)

ELECTRON CHANNELING CONTRAST IMAGING (ECCI) OF DISLOCATIONS IN BULK SPECIMENS
par: Czernuszka, J, et autres
Publié: (1991)

ELECTRON CHANNELING CONTRAST IMAGING OF INTERFACIAL DEFECTS IN STRAINED SILICON-GERMANIUM LAYERS ON SILICON
par: Wilkinson, A, et autres
Publié: (1993)

Effects of surface relaxation on electron channelling contrast images of misfit dislocations
par: Wilkinson, A, et autres
Publié: (1994)

IMAGING OF SEMICONDUCTOR DEFECTS USING ION CHANNELING
par: King, P, et autres
Publié: (1993)

Multiple scattering simulation of electron channelling contrast images of dislocations at interfaces
par: Dudarev, S, et autres
Publié: (1995)

EBIC CONTRAST OF DEFECTS IN SEMICONDUCTORS
par: Wilshaw, P, et autres
Publié: (1991)

IMAGING OF DISLOCATIONS USING BACKSCATTERED ELECTRONS IN A SCANNING ELECTRON-MICROSCOPE
par: Czernuszka, J, et autres
Publié: (1990)

THE EFFECTS OF SURFACE STRESS-RELAXATION ON ELECTRON CHANNELING CONTRAST IMAGES OF DISLOCATIONS
par: Wilkinson, A, et autres
Publié: (1995)

Characterizing dislocation structures in bulk fatigued copper single crystals using electron channelling contrast imaging (ECCI)
par: Ahmed, J, et autres
Publié: (1997)

Survey of semiconductor physics : electrons and other particles in bulk semiconductors /
par: 342198 Boer, Karl W.
Publié: (1990)

Electron channelling contrast imaging of dislocation substructures in the vicinity of short fatigue cracks in Cu
par: Ahmed, J, et autres
Publié: (1998)

Defect electronics in semiconductors
par: 269076 Matare, Herbert Franz
Publié: (1971)

The methodology of modeling of electronic properties of bulk semiconductor compounds
par: A. V. Krivosheeva, et autres
Publié: (2019-06-01)

OpenECCI - A Streamlined Open-Source Workflow for Electron Channelling Contrast Imaging of Crystal Defects
par: Xu Zhou, et autres
Publié: (2024-01-01)

Electron channeling and ion channeling contrast imaging of dislocations in nitride thin films
par: Trager-Cowan, C, et autres
Publié: (2008)

Theory of defects in solids : electronic structure of defects in insulators and semiconductors
par: 375532 Stoneham, A. M.
Publié: (1975)

EFFECT OF SURFACE-CHARGE ON THE DISLOCATION MOBILITY IN SEMICONDUCTORS
par: Czernuszka, J
Publié: (1989)

EFFECT OF SURFACE-CHARGE ON THE DISLOCATION MOBILITY IN SEMICONDUCTORS
par: Czernuszka, J
Publié: (1989)

Examination of dislocation substructures in fatigued Cu using electron channelling contrast imaging
par: Ahmed, J, et autres
Publié: (1999)

Characterization of nitride thin films by electron backscatter diffraction and electron channeling contrast imaging
par: Trager-Cowan, C, et autres
Publié: (2006)

Characterisation of nitride thin films by electron backscatter diffraction and electron channelling contrast imaging
par: Trager-Cowan, C, et autres
Publié: (2006)

Hydrogen in semiconductors : bulk and surface properties/
par: Trieste IUPAP-ICTP Semiconductor Symposium (6th : 1990 : Trieste, Italy), et autres
Publié: (1991)

Defects in semiconductors/
par: Narayan, J., et autres
Publié: (1980)

Electron diffraction based techniques in scanning electron microscopy of bulk materials
par: Wilkinson, A, et autres
Publié: (1998)

Electron diffraction based techniques in scanning electron microscopy of bulk materials
par: Wilkinson, A, et autres
Publié: (1997)

Weakly Supervised Image Segmentation for Detecting Defects From Scanning Electron Microscopy Images in Semiconductor
par: Younghwan Lee, et autres
Publié: (2024-01-01)

Depth Dependence of Electron Channeling Contrast Imaging in Gallium Nitride
par: Lavallee Etienne, et autres
Publié: (2024-01-01)

Electron backscatter diffraction and electron channeling contrast imaging of tilt and dislocations in nitride thin films
par: Trager-Cowan, C, et autres
Publié: (2007)

Compound semiconductor bulk materials and characterizations /
par: 173111 Oda, Osamu
Publié: (2007)

Quantitative simulations of electron channelling patterns and electron backscattering from crystals
par: Dudarev, S, et autres
Publié: (1994)

Characterizing dislocation structure evolution during cyclic deformation using electron channelling contrast imaging
par: Ahmed, J, et autres
Publié: (2006)

Electron Channeling Contrast Imaging (ECCI) of Ion Battery Cathode Materials
par: Naghizadeh Meysam, et autres
Publié: (2024-01-01)

A Review on Machine and Deep Learning for Semiconductor Defect Classification in Scanning Electron Microscope Images
par: Francisco López de la Rosa, et autres
Publié: (2021-10-01)

Automatic Semiconductor Wafer Image Segmentation for Defect Detection Using Multilevel Thresholding
par: Saad N.H., et autres
Publié: (2016-01-01)

SEM imaging of contrast arising from different doping concentrations in semiconductors
par: Sealy, C, et autres
Publié: (1995)

Weyl points and exceptional rings with polaritons in bulk semiconductors
par: R. L. Mc Guinness, et autres
Publié: (2020-11-01)

Bulk versus Contact Doping in Organic Semiconductors
par: Chang-Hyun Kim
Publié: (2021-06-01)

Stabilization of semiconductor surfaces through bulk dopants
par: Nikolaj Moll, et autres
Publié: (2013-01-01)