Structure determination of atomically controlled crystal architectures grown within single wall carbon nanotubes.
Indirect high resolution electron microscopy using one of several possible data-set geometries offers advantages over conventional high-resolution imaging in enabling the recovery of the complex wavefunction at the specimen exit plane and simultaneously eliminating the aberrations present in the obj...
Main Authors: | Kirkland, A, Meyer, R, Sloan, J, Hutchison, J |
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Formato: | Journal article |
Idioma: | English |
Publicado em: |
2005
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