Structure determination of atomically controlled crystal architectures grown within single wall carbon nanotubes.

Indirect high resolution electron microscopy using one of several possible data-set geometries offers advantages over conventional high-resolution imaging in enabling the recovery of the complex wavefunction at the specimen exit plane and simultaneously eliminating the aberrations present in the obj...

Повний опис

Бібліографічні деталі
Автори: Kirkland, A, Meyer, R, Sloan, J, Hutchison, J
Формат: Journal article
Мова:English
Опубліковано: 2005