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CYCLOTRON-RESONANCE MEASUREMEN...
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CYCLOTRON-RESONANCE MEASUREMENTS ON P-TYPE STRAINED-LAYER SI1-XGEX/SI HETEROSTRUCTURES
Bibliographic Details
Main Authors:
Wong, S
,
Kinder, D
,
Nicholas, R
,
Whall, T
,
Kubiak, R
Format:
Journal article
Published:
1995
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