CYCLOTRON-RESONANCE MEASUREMENTS ON P-TYPE STRAINED-LAYER SI1-XGEX/SI HETEROSTRUCTURES

CYCLOTRON-RESONANCE MEASUREMENTS ON P-TYPE STRAINED-LAYER SI1-XGEX/SI HETEROSTRUCTURES

Bibliographic Details
Main Authors:	Wong, S, Kinder, D, Nicholas, R, Whall, T, Kubiak, R
Format:	Journal article
Published:	1995

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