Nanostructural physical and chemical information derived from the unit cell scattering amplitudes of a spider dragline silk
Characterizing the nanostructures of spider major ampullate (dragline) silks is an important step in understanding the origin of their high mean strength and toughness, and for producing polymeric analogs that mimic these properties. Here we present transmission electron microscopy (TEM) diffraction...
Main Authors: | , , , |
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Format: | Journal article |
Language: | English |
Published: |
2005
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