Tuning of the electronic characteristics of ZnO nanowire field effect transistors by proton irradiation

We demonstrated a controllable tuning of the electronic characteristics of ZnO nanowire field effect transistors (FETs) using a high-energy proton beam. After a short proton irradiation time, the threshold voltage shifted to the negative gate bias direction with an increase in the electrical conduct...

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Bibliographic Details
Main Authors: Hong, W, Jo, G, Sohn, J, Park, W, Choe, M, Wang, G, Kahng, Y, Welland, M, Lee, T
Format: Journal article
Language:English
Published: 2010

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