Tuning of the electronic characteristics of ZnO nanowire field effect transistors by proton irradiation
We demonstrated a controllable tuning of the electronic characteristics of ZnO nanowire field effect transistors (FETs) using a high-energy proton beam. After a short proton irradiation time, the threshold voltage shifted to the negative gate bias direction with an increase in the electrical conduct...
Main Authors: | Hong, W, Jo, G, Sohn, J, Park, W, Choe, M, Wang, G, Kahng, Y, Welland, M, Lee, T |
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Format: | Journal article |
Language: | English |
Published: |
2010
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