Measurement of small misorientations using electron back scatter diffraction
This paper concerns the determination of small misorientations using electron back scatter diffraction (EBSD). Generally EBSD is used to measure crystal orientations from which misorientations can be calculated. Repeated measurements on undeformed Si showed that the calculated misorientations have a...
Κύριος συγγραφέας: | Wilkinson, A |
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Μορφή: | Conference item |
Έκδοση: |
1999
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Παρόμοια τεκμήρια
Παρόμοια τεκμήρια
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A new method for determining small misorientations from electron back scatter diffraction patterns
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