$Measurement of small misorientations using electron back scatter diffraction$

Measurement of small misorientations using electron back scatter diffraction

This paper concerns the determination of small misorientations using electron back scatter diffraction (EBSD). Generally EBSD is used to measure crystal orientations from which misorientations can be calculated. Repeated measurements on undeformed Si showed that the calculated misorientations have a...

書誌詳細
第一著者:	Wilkinson, A
フォーマット:	Conference item
出版事項:	1999

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