$High energy white beam x-ray diffraction studies of residual strains in engineering components$

High energy white beam x-ray diffraction studies of residual strains in engineering components

Näytä muut versiot (2)

In order to predict the durability of engineering components and improve performance, it is mandatory to understand residual stresses. The last decade has witnessed a significant increase of residual stress evaluation using diffraction of penetrating radiation, such as neutrons or high energy X-rays...

Bibliografiset tiedot
Päätekijät:	Zhang, S, Vorster, W, Jun, T, Song, X, Golshan, M, Laundy, D, Walsh, M, Korsunsky, A
Muut tekijät:	International Association of Engineers (IAENG)
Aineistotyyppi:	Conference item
Kieli:	English
Julkaistu:	American Institute of Physics 2008
Aiheet:	Engineering & allied sciences

Samankaltaisia teoksia

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Neutron diffraction measurement and finite element modelling of residual strains due to bath and spray quenching of AISI 316L stainless steel cylinders
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Diffraction strain measurements for the characterization of residual stresses in welds for gas turbine applications
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Variational eigenstrain analysis of synchrotron diffraction measurements of residual elastic strain in a bent titanium alloy bar
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Analysis of plastic deformation and residual elastic strain in a titanium alloy using synchrotron x-ray diffraction
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Inter-granular residual stresses in polycrystalline aggregates: finite element modelling and diffraction post-processing
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Measurement of residual elastic strains in a titanium alloy using high energy synchrotron X-ray diffraction
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High energy synchrotron X-ray measurements of 2D residual stress states in metal matrix composites
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Residual stresses in induction-hardened gear teeth mapped by neutron diffraction
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An analysis of residual stresses and strains in shot peening
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Plastic bending of a residually stressed beam
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Residual elastic strain due to laser shock peening: synchrotron diffraction measurement
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Residual stress analysis in shot peened and fretting fatigued samples by the eigenstrain method
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Intergranular lattice misorientation mapping by synchrotron x-ray micro-beams: Laue vs energy-resolved Laue vs monochromatic reciprocal space analysis
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