Wellman, J., George, T., Leon, R., Fafard, S., Zou, J., & Cockayne, D. (1999). Transmission electron microscopy study of InGaAs/GaAs structural evolution near the Stranski-Krastanow transformation.
芝加哥风格引文Wellman, J., T. George, R. Leon, S. Fafard, J. Zou, 与 D. Cockayne. Transmission Electron Microscopy Study of InGaAs/GaAs Structural Evolution Near the Stranski-Krastanow Transformation. 1999.
MLA引文Wellman, J., et al. Transmission Electron Microscopy Study of InGaAs/GaAs Structural Evolution Near the Stranski-Krastanow Transformation. 1999.
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