Transmission electron microscopy study of InGaAs/GaAs structural evolution near the Stranski-Krastanow transformation
An experimental study of the microstructure during formation and evolution of MOCVD-grown In0.6Ga0.4As/GaAs quantum dots (QDs) was undertaken to provide a more thorough understanding of the underlying growth principles. Transmission Electron Microscopy (TEM) was used to examine the evolution of the...
| Հիմնական հեղինակներ: | , , , , , |
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| Ձևաչափ: | Conference item |
| Հրապարակվել է: |
1999
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