Transmission electron microscopy study of rf-sputtered (Bi, Pb)(2)Sr2Ca2Cu3Oy thin films on MgO substrates
The interface of epitaxial c-axis-oriented (Bi, Pb)2Sr2Can-1 CunO2n+4+x thin films grown by rf sputtering on MgO substrates has been investigated by high-resolution transmission electron microscopy. It was found that, in spite of the roughness of the substrate surface, the lattice of the film orient...
| Những tác giả chính: | , , , , |
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| Định dạng: | Journal article |
| Ngôn ngữ: | English |
| Được phát hành: |
1997
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