Rasche, B., & Ruck, M. (2018). High-temperature-phase Bi4RhI2: Electronic localization by structural distortion. American Chemical Society.
Style de citation Chicago (17e éd.)Rasche, B., et M. Ruck. High-temperature-phase Bi4RhI2: Electronic Localization by Structural Distortion. American Chemical Society, 2018.
Style de citation MLA (9e éd.)Rasche, B., et M. Ruck. High-temperature-phase Bi4RhI2: Electronic Localization by Structural Distortion. American Chemical Society, 2018.
Attention : ces citations peuvent ne pas être correctes à 100%.