Rasche, B., & Ruck, M. (2018). High-temperature-phase Bi4RhI2: Electronic localization by structural distortion. American Chemical Society.
शिकागो शैली (17वां संस्करण) प्रशस्ति पत्रRasche, B., और M. Ruck. High-temperature-phase Bi4RhI2: Electronic Localization by Structural Distortion. American Chemical Society, 2018.
एमएलए (9वां संस्करण) प्रशस्ति पत्रRasche, B., और M. Ruck. High-temperature-phase Bi4RhI2: Electronic Localization by Structural Distortion. American Chemical Society, 2018.
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