Rasche, B., & Ruck, M. (2018). High-temperature-phase Bi4RhI2: Electronic localization by structural distortion. American Chemical Society.
Citazione stile Chigago Style (17a edizione)Rasche, B., e M. Ruck. High-temperature-phase Bi4RhI2: Electronic Localization by Structural Distortion. American Chemical Society, 2018.
Citatione MLA (9a ed.)Rasche, B., e M. Ruck. High-temperature-phase Bi4RhI2: Electronic Localization by Structural Distortion. American Chemical Society, 2018.
Attenzione: Queste citazioni potrebbero non essere precise al 100%.