A Stein goodness-of-test for exponential random graph models

We propose and analyse a novel nonparametric goodness-of-fit testing procedure for exchangeable exponential random graph model (ERGM) when a single network realisation is observed. The test determines how likely it is that the observation is generated from a target unnormalised ERGM density. Our tes...

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书目详细资料
Main Authors: Xu, W, Reinert, G
格式: Journal article
语言:English
出版: Journal of Machine Learning Research 2021